Application of acoustic technique to determine the temperature range of quenched-in defect mobility in Cu-Al-Be β′1 martensitic phase

Scripta Materialia

Volumn 43, Issue 10, 2000, Pages 905-911

  Kustov, S ^a   Golyandin, S ^a   Sapozhnikov, K ^a   Morin, M ^b  

^a IOFFE INSTITUTE   (Russian Federation)

^b UNIVERSITÉ DE LYON   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; DIFFUSION IN SOLIDS; DISLOCATIONS (CRYSTALS); INTERFACES (MATERIALS); INTERNAL FRICTION; MARTENSITIC TRANSFORMATIONS; POINT DEFECTS; POSITRON ANNIHILATION SPECTROSCOPY; PRECIPITATION (CHEMICAL); QUENCHING; THERMAL EFFECTS; THERMOELASTICITY;

ATOMIC DIFFUSION; COPPER ALUMINUM BERRYLIUM ALLOY; ORDERING; PINNING DISLOCATION; QUENCHED-IN DEFECT MOBILITY;

COPPER ALLOYS;

EID: 0034292060     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(00)00511-X     Document Type: Article

References (13)

1. Tadaki T. Otsuka K., Wayman C.M. Shape Memory Materials. 1998;97 Cambridge University Press, Cambridge, UK.
2. Cingolani E., Van Humbeeck J., Ahlers M. Metall. Mater. Trans. A. 30A:1999;493.
3. Kong Y., Jiang B., Hsu T.J., Wang B., Wang T. Mater. Res. Soc. Symp. Proc. 246:1992;25.
4. Kong Y., Jiang B., Hsu T.J., Wang B., Wang T. Phys. Stat. Sol. (a). 133:1992;269.
5. Kustov S., Golyandin S., Sapozhnikov K., Van Humbeeck J., De Batist R. Acta Mater. 46:1998;5117.
6. S. Kustov, S. Golyandin, K. Sapozhnikov, J. Van Humbeeck, and R. De Batist, J. Alloys Compounds. in press.
7. Sapozhnikov K., Golyandin S., Kustov S., Van Humbeeck J., De Batist R. Acta Mater. 48:2000;1141.
8. In preparation.
9. W. H. Robinson and A. Edgar. IEEE Trans. Sonics Ultrasonics. SU-21, 98 (1974).
10. S. B. Kustov, B. K. Kardashev, V. I. Ivanov, S. N. Golyandin, Yu. A. Burenkov, S. P. Nikanorov, V. M. Chernov, H. Lüft, G. Mattausch, Hegenbart, and Y. Schreiber, Preprint FEI-2141. Obninsk, 1990 (in Russian).
11. R. De Batist, in ASTM STP 1169, ed. V. K. Kinra and A. Volfenden, p. 45, American Society for Testing and Materials, Philadelphia (1992).
12. Chambers R.H., Smoluchowski R. Phys. Rev. 117:1960;725.
13. R. J. Gotthardt. J. Phys. IV. 43, C4-667 (1982).