Scattering effects and neutralization efficiency of argon for neutral injection accelerator mass spectrometry

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 172, Issue 1-4, 2000, Pages 293-298

  DeTurck, T M ^a   Knies, D L ^b   Grabowski, K S ^b   Hubler, G K ^b   Treacy, D J ^a   Mignerey, A C ^a  

^a University of Maryland   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

Accelerator mass spectrometry; Charge neutralization; Charge transfer; Neutral injection

Indexed keywords

ARGON; CHARGE TRANSFER; ION IMPLANTATION; IONIZATION; IONS;

ACCELERATOR MASS SPECTROMETRY; NEUTRAL INJECTION; NEUTRALIZATION EFFICIENCY; SCATTERING EFFECTS;

MASS SPECTROMETRY;

EID: 0034291981     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(00)00144-0     Document Type: Article

References (9)

1. J. Vickerman, A. Brown, N. Reed (Eds.), Secondary Ion Mass Spectrometry: Principles and Applications, Clarendon Press, Oxford, 1989.
2. A.E. Litherland, L.R. Kilius, Nucl. Instr. and Meth. B 123 (1997) 18.
3. S. Sakabe, Y. Izawa, Atom. Data and Nucl. Data Tables 49 (1991) 257.
4. R.C. Dehmel, H.K. Chau, H.H. Fleischmann, Atom. Data 5 (1973) 231.
5. X. Zhang, Z. Wang, L. Hu, Rev. Sci. Instr. 65 (1994) 1231.
6. H. Massey, H. Gilbody, Electronic and Ionic Impact Phenomena, Vol. 4, Clarendon Press, Oxford, 1974.
7. A.B. Wittkower, H.D. Betz, Atom. Data 5 (1973) 113.
8. A. Burgi, M. Oetliker, P. Bochsler, J. Geiss, M. Coplan, J. Appl. Phys. 68 (1990) 2547.
9. M. Gonin, R. Kallenbach, P. Bochsler, Nucl. Instr. and Meth. B 94 (1994) 15.