Ion-source modeling and improved performance of the CAMS high-intensity Cs-sputter ion source

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 172, Issue 1-4, 2000, Pages 344-349

  Brown, T A ^a   Roberts, M L ^a   Southon, J R ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

Charged particle beam sources; Computer codes; Ion sources; Mass spectrometry

Indexed keywords

CESIUM; COMPUTER SIMULATION; ELECTRIC FIELDS; ELECTRIC SPACE CHARGE; MASS SPECTROMETRY; NEGATIVE IONS; POISSON EQUATION;

ACCELERATOR MASS SPECTROMETRY; CESIUM SPUTTER ION SOURCE; CHARGE DISTRIBUTION; CHILDS LAW MODELING; ION TRAJECTORIES; SPACE CHARGE EFFECTS;

ION SOURCES;

EID: 0034291980     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(00)00202-0     Document Type: Article

References (3)

1. I.D. Proctor, J.R. Southon, M.L. Roberts, J.C. Davis, D.W. Heikkinen, T.L. Moore, J.L. Garibaldi, T.A. Zimmerman, Nucl. Instr. and Meth. B 52 (1990) 334.
2. M.L. Roberts, P.J. Norman, J.L. Garibaldi, R.S. Hornady, Nucl. Instr. and Meth. B 92 (1994) 111.
3. J.R. Southon, M.L. Roberts, Nucl. Instr. and Meth. 172 (2000).