Low-stress hybridisation of emitters, detectors and driver circuitry on a silicon motherboard for optoelectronic interconnect architecture

Materials Science in Semiconductor Processing

Volumn 3, Issue 5-6, 2000, Pages 449-453

  Corbett, B ^a   Rodgers, K ^a   Stam, F A ^a   O'Connell, D ^a   Kelly, P V ^a   Crean, G M ^a  

^a UNIVERSITY COLLEGE CORK   (Ireland)

Author keywords

Hybridisation; Interconnect; Optoelectronic; Substrate removal; VCSEL

Indexed keywords

CMOS INTEGRATED CIRCUITS; OPTICAL INTERCONNECTS; PHOTODETECTORS; PRINTED CIRCUIT BOARDS; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR LASERS;

OPTOELECTRONIC INTERCONNECTS; VERTICAL CAVITY SURFACE EMITTING LASERS (VCSEL);

INTEGRATED OPTOELECTRONICS;

EID: 0034291798     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-8001(00)00072-X     Document Type: Article

References (1)

1. Goossen KW, et al. Photon Technol Lett 1995;7:360.