Stress-induced effects by the anodic oxide in ridge waveguide laser diodes

IEEE Journal of Quantum Electronics

Volumn 36, Issue 10, 2000, Pages 1174-1183

  Buda, M ^a   Iordache, G ^a   Acket, G A ^a   Van De Roer, T G ^a   Kaufmann, L M F ^a   Van Roy, B H ^a   Smalbrugge, E ^a   Moerman, I ^b   Sys, C ^b  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b GHENT UNIVERSITY   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ANODIC OXIDATION; MATHEMATICAL MODELS; OPTICAL WAVEGUIDES; SEMICONDUCTOR DEVICE MODELS; THERMAL EFFECTS;

ANODIC OXIDE; LOW THRESHOLD DEVICES; RIDGE WAVEGUIDE LASER DIODES; STRESS INDUCED EFFECTS;

INJECTION LASERS;

EID: 0034291470     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/3.880658     Document Type: Article

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