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Volumn 172, Issue 1-4, 2000, Pages 647-654

Study of resonant reactions with radioactive ion beams

Author keywords

Radioactive ion beams; Resonance scattering; Silicon microstrip detectors

Indexed keywords

ATOMS; ELECTRON RESONANCE; INVERSE KINEMATICS; IONS; MASS SPECTROMETRY; NUCLEAR PHYSICS; PARTICLE ACCELERATORS; RADIOACTIVITY; SILICON SENSORS;

EID: 0034291228     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(00)00220-2     Document Type: Article
Times cited : (23)

References (18)
  • 17
    • 9444273822 scopus 로고    scopus 로고
    • Micron Semiconductor Ltd., Lancing, Sussex BN15 8UN, England
    • Micron Semiconductor Ltd., Lancing, Sussex BN15 8UN, England.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.