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Volumn 15, Issue 4, 2000, Pages 1110-1115

Computation of the short-term flicker severity index

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL METHODS; ELECTRIC MEASURING INSTRUMENTS; FLICKERING; INTERPOLATION; ITERATIVE METHODS; PERFORMANCE; PROBABILITY DENSITY FUNCTION; STATISTICAL METHODS;

EID: 0034290033     PISSN: 08858977     EISSN: None     Source Type: Journal    
DOI: 10.1109/61.891490     Document Type: Article
Times cited : (23)

References (6)
  • 1
    • 0003530101 scopus 로고
    • Flickermeter - Functional and design specifications
    • IEC Publication 868
    • IEC Publication 868, "Flickermeter - Functional and design specifications,", Tech. Rep., IEC, 1986.
    • (1986) Tech. Rep., IEC
  • 2
    • 0005876660 scopus 로고
    • Flickermeter - Evaluation of flicker severity
    • IEC Publication 868
    • IEC Publication 868, "Flickermeter - Evaluation of flicker severity,", Tech. Rep., IEC, pt. 0, 1991.
    • (1991) Tech. Rep., IEC , Issue.PART
  • 5
    • 0026237899 scopus 로고
    • Digital measurement of voltage flicker
    • Oct.
    • K. Srinivasan, "Digital measurement of voltage flicker," IEEE Trans. Power Delivery, vol. 6, no. 4, pp. 1593-1598, Oct. 1991.
    • (1991) IEEE Trans. Power Delivery , vol.6 , Issue.4 , pp. 1593-1598
    • Srinivasan, K.1
  • 6
    • 0028570911 scopus 로고
    • Digital multirate algorithms for measurement of voltage, current, power and flicker
    • L. Toivonen and J. Mörsky, "Digital multirate algorithms for measurement of voltage, current, power and flicker," in IEEE PES Trans. and Dist. Conference Proceedings, 1994, pp. 330-340.
    • (1994) IEEE PES Trans. and Dist. Conference Proceedings , pp. 330-340
    • Toivonen, L.1    Mörsky, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.