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Volumn 28, Issue 5, 2000, Pages 1316-1323

FANTM: first article NIF test module

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; COMPUTER SIMULATION; ELECTRIC ARCS; FAILURE ANALYSIS; FLASHLIGHTS; SEMICONDUCTOR LASERS; TEST FACILITIES; WAVEFORM ANALYSIS;

EID: 0034289911     PISSN: 00933813     EISSN: None     Source Type: Journal    
DOI: 10.1109/27.901190     Document Type: Article
Times cited : (22)

References (5)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.