In situ high pressure X-ray diffraction and EXAFS spectroscopy of icosahedral Al-Cu-Ru quasicrystals

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 80, Issue 9, 2000, Pages 2057-2071

  Sadoc, A ^a,b   Itie J P ^b,c   Polian, A ^b,c  

^a UNIVERSITÉ DE CERGY PONTOISE   (France)

^b UNIVERSITÉ PARIS SACLAY   (France)

^c SORBONNE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ATOMIC PHYSICS; COMPRESSION TESTING; COPPER; HIGH PRESSURE EFFECTS; HYDROSTATIC PRESSURE; LATTICE CONSTANTS; ORDER DISORDER TRANSITIONS; QUASICRYSTALS; X RAY DIFFRACTION ANALYSIS;

ABSORPTION EDGE; BULK MODULUS; DIFFRACTION MEASUREMENTS; PHASON DISORDER; PLATEAU BEHAVIOUR; PRESSURE DERIVATIVE;

ALUMINUM ALLOYS;

EID: 0034286585     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418610008212150     Document Type: Article

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