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Volumn 33, Issue 17, 2000, Pages 2117-2124

Ferroelectric behaviour of PZT thin films with secondary TiO2 phase induced defects

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; DIELECTRIC RELAXATION; FERROELECTRIC MATERIALS; FERROELECTRICITY; HYSTERESIS; LEAD COMPOUNDS; PERMITTIVITY; PHASE TRANSITIONS; POLARIZATION; THERMAL EFFECTS; THIN FILMS; TITANIUM DIOXIDE;

EID: 0034275847     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/33/17/305     Document Type: Article
Times cited : (4)

References (32)
  • 2
    • 0000392228 scopus 로고
    • ed E R Myers and A I Kingon (Pittsburgh, PA: Material Research Society)
    • Roy R A, Etzold K F and Cuomo J J 1990 Ferroelectric Thin Films ed E R Myers and A I Kingon (Pittsburgh, PA: Material Research Society) vol 200, pp 141-52
    • (1990) Ferroelectric Thin Films , vol.200 , pp. 141-152
    • Roy, R.A.1    Etzold, K.F.2    Cuomo, J.J.3
  • 12
    • 0029223648 scopus 로고
    • ed B A Tuttle et al (Pittsburgh, PA: Materials Research Society)
    • Darvish S R and Rastogi A C 1995 Ferroelectric Thin Films IV ed B A Tuttle et al (Pittsburgh, PA: Materials Research Society) 361 507-12
    • (1995) Ferroelectric Thin Films IV , vol.361 , pp. 507-512
    • Darvish, S.R.1    Rastogi, A.C.2
  • 16
    • 0003495856 scopus 로고
    • (Swarthmores: International Centre for Diffraction Data) File #6-0452
    • McClune W F (ed) 1986 Powder Diffraction File-Inorganic Phases (Swarthmores: International Centre for Diffraction Data) File #6-0452
    • (1986) Powder Diffraction File-Inorganic Phases
    • McClune, W.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.