Photocurrent and photoelectron yield spectroscopies of defect states in CVD diamond films

Physica Status Solidi (A) Applied Research

Volumn 181, Issue 1, 2000, Pages 29-35

  Rossi, M C ^a   Salvatori, S ^a   Scotti, F ^a   Conte, G ^a   Cappelli, E ^b  

^a ROMA TRE UNIVERSITY   (Italy)

^b CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTAL DEFECTS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; ELECTRON TRANSITIONS; ENERGY GAP; GRAIN SIZE AND SHAPE; MORPHOLOGY; PHOTOELECTRON SPECTROSCOPY; PHOTOIONIZATION; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY;

PHOTOCURRENT SPECTROSCOPY; PHOTOELECTRON YIELD SPECTROSCOPY; POLYCRYSTALLINE FILM; SUB-BAND-GAP PHOTOCURRENT;

DIAMOND FILMS;

EID: 0034275306     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200009)181:1<29::AID-PSSA29>3.0.CO;2-J     Document Type: Article

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