Kinetic and mechanistic studies of rare earth-rich protective film formation using in situ ellipsometry

Journal of the Electrochemical Society

Volumn 147, Issue 9, 2000, Pages 3286-3293

  Bohm S ^a,b   Greef, R ^a   McMurray, H N ^a   Powell, S M ^a,b   Worsley, D A ^a  

^a SWANSEA UNIVERSITY   (United Kingdom)

^b UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; INTERFACES (MATERIALS); METALLIC FILMS; PROTECTIVE COATINGS; RARE EARTH ELEMENTS; REDOX REACTIONS; SUBSTRATES;

HYDROXIDE FILMS; SUBSTRATE-SOLUTION INTERFACES;

ELECTRODEPOSITION;

EID: 0034275304     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1393897     Document Type: Article

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