Quantification of localised loss of material;Quantifizierung von lokalem Materialabtrag

Praktische Metallographie/Practical Metallography

Volumn 37, Issue 9, 2000, Pages 477-486

  Soldera, Flavio ^a   Rota, Montserrat Sierra ^a   Ilic, Nenad ^a   Mücklich, Frank ^a  

^a SAARLAND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOYS; ELECTRIC ARCS; INTERFEROMETRY; INTERMETALLICS; OPTICAL MICROSCOPY; SURFACE STRUCTURE; CONDENSED MATTER PHYSICS; MAGNETIC MATERIALS;

ARCING; ELECTROEROSION; SCANNING WHITE LIGHT INTERFERENCE MICROSCOPE;

EROSION; MICROSCOPES;

LATERAL RESOLUTION; MATERIAL LOSS; MULTI-PHASE STRUCTURES; PHYSICAL CHARACTERISTICS; POLISHED SURFACES; VERTICAL RESOLUTION; WHITE LIGHT; WHITE LIGHT INTERFERENCE;

EID: 0034274872     PISSN: 0032678X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

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