Intimate interactions at a junction interface between poly(3-methylthiophene) and titanium oxide

Electrochemical and Solid-State Letters

Volumn 3, Issue 9, 2000, Pages 426-428

  Hoshino, Katsuyoshi ^a   Inui, Masaaki ^a   Kitamura, Takashi ^a   Kokado, Hiroshi ^a  

^a CHIBA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; CRYSTAL STRUCTURE; DEPOSITION; ELECTROPOLYMERIZATION; FIRING (OF MATERIALS); INTERFACES (MATERIALS); SEMICONDUCTING FILMS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING POLYMERS; SURFACES; TITANIUM OXIDES; X RAY DIFFRACTION ANALYSIS;

ELECTROCHEMICAL DEPOSITION; POLYMETHYLTHIOPENE; SURFACE WORK FUNCTION MEASUREMENT; THERMOELECTRIC POWER MEASUREMENT;

ELECTROCHEMISTRY;

EID: 0034274771     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1391167     Document Type: Article

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