Spectral analysis for the effects of stylus tip curvature on measuring fractal profiles

Measurement Science and Technology

Volumn 11, Issue 9, 2000, Pages 1369-1376

  Wu, Jiunn Jong ^a,b  

^a CHINESE CULTURE UNIVERSITY   (Taiwan)

^b NONE   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ESTIMATION; FRACTALS; SURFACE ROUGHNESS;

STYLUS TIP CURVATURE;

ROUGHNESS MEASUREMENT;

EID: 0034274560     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/11/9/317     Document Type: Article

References (10)