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Volumn 463, Issue 2, 2000, Pages 102-108

Oxidation of the H-Si(111)-1×1 surface: High resolution Si 2p core-level spectroscopy with synchrotron radiation

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; HYDROGEN; OXIDATION; SEMICONDUCTING SILICON; SYNCHROTRON RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0034274061     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00488-X     Document Type: Article
Times cited : (8)

References (18)
  • 8
    • 0343167910 scopus 로고    scopus 로고
    • Ph.D. Thesis, Université Denis Diderot, Paris
    • C. Poncey, Ph.D. Thesis, Université Denis Diderot, Paris, 1996.
    • (1996)
    • Poncey, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.