Effect of annealing and γ-irradiation on the properties of CuInSe2 thin films

Materials Letters

Volumn 45, Issue 5, 2000, Pages 251-261

  Ramaiah, Kodigala Subba ^a,b,c   Raja, Vanjari Sundara ^b   Bhatnagar, Anil Kumar ^c   Juang, Fuh Shyang ^d   Chang, Shoou Jinn ^a   Su, Yan Kuin ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b SRI VENKATESWARA UNIVERSITY   (India)

^c UNIVERSITY OF HYDERABAD   (India)

^d NATIONAL FORMOSA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COPPER COMPOUNDS; CRYSTAL ORIENTATION; DEPOSITION; ELECTRIC CONDUCTIVITY OF SOLIDS; POLYCRYSTALLINE MATERIALS; PYROLYSIS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

BURSTEIN-MOSS SHIFT; MOTT PARAMETERS; SELECTED AREA DIFFRACTION (SAD) ANALYSIS;

METALLIC FILMS;

EID: 0034273824     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(00)00114-2     Document Type: Article

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