Charge-state resolved above threshold ionization

Physical Review Letters

Volumn 85, Issue 11, 2000, Pages 2268-2271

  Witzel, B ^a,b   Papadogiannis, N A ^a   Charalambidis, D ^a,c  

^a INSTITUTE OF ELECTRONIC STRUCTURE AND LASER   (Greece)

^b UNIVERSITY OF FREIBURG   (Germany)

^c UNIVERSITY OF CRETE   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED PARTICLES; ELECTRONS; IONIZATION; LASER PULSES; PHOTOELECTRON SPECTROSCOPY; PRESSURE; TEMPERATURE;

ABOVE THRESHOLD IONIZATION; ELECTRON ION COINCIDENCE MEASUREMENT; ELECTRON TEMPERATURE; HIGH RESOLUTION PHOTOELECTRON SPECTROSCOPY;

XENON;

EID: 0034273414     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.2268     Document Type: Article

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