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Volumn 8, Issue 9, 2000, Pages 20-22
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Imaging indents - characterizing materials on the nano scale
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Author keywords
[No Author keywords available]
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Indexed keywords
FRACTURE TOUGHNESS;
HARDNESS TESTING;
MICROSCOPIC EXAMINATION;
OPTICAL RESOLVING POWER;
SURFACE STRUCTURE;
NANO HARDNESS TESTERS;
SCANNING FORCE MICROSCOPES;
NANOSTRUCTURED MATERIALS;
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EID: 0034272978
PISSN: 09678638
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
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Times cited : (2)
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References (5)
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