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Volumn 66, Issue 2, 2000, Pages 49-56

Critical plane approach with two families of microcracks for modelling of unilateral fatigue damage

Author keywords

[No Author keywords available]

Indexed keywords

FATIGUE OF MATERIALS; MATHEMATICAL MODELS; MICROCRACKS; STRESS ANALYSIS; TENSORS; VECTORS;

EID: 0034272462     PISSN: 00157899     EISSN: None     Source Type: Journal    
DOI: 10.1007/s100100000036     Document Type: Article
Times cited : (4)

References (26)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.