Strain sensing based on coherent Rayleigh scattering in an optical fibre

Electronics Letters

Volumn 36, Issue 20, 2000, Pages 1688-1689

  Posey Jr , R ^a,b   Johnson, G A ^a   Vohra, S T ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

^b VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE BACKSCATTERING; FIBER LASERS; MICROPROCESSOR CHIPS; OPTICAL COMMUNICATION; OPTICAL FIBERS; STRAIN GAGES; STRAIN MEASUREMENT; TIME DIVISION MULTIPLEXING;

ERBIUM-DOPED AMPLIFIERS; FIBER OPTIC STRAIN SENSORS; INTEGRATED OPTICAL CHIPS; OPTICAL CIRCULATORS;

FIBER OPTIC SENSORS;

EID: 0034272384     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20001200     Document Type: Article

References (7)

1. RATHOD, R., PECHSTEDT, R.D., JACKSON, D.A., and WEBB, D.J.: 'Distributed temperature-change sensor based on Rayleigh backscattering in an optical fiber', Opt. Lett., 1994, 19, (8), pp. 593-5 95
2. JUSKATIS, R., MAMEDOV, A.M., POTAPOV, V.T., and SHATALIN, S.V.: 'Interferometry with Rayleigh backscattering in a single-mode optical fiber'. Opt. Lett., 1994, 19, (3), pp. 225-227
3. JUSKATIS, R., MAMEDOV, A.M., POTAPOV, V.T., and SHATALIN, S.V.: 'Distributed interferometric fiber sensor system', Opt. Lett., 1992, 17, (22), pp. 1623-1625
4. KUNG, A., BUDIN, J., THEVENAZ, L., and ROBERT, PH.A.: 'Rayleigh fiber optics gyroscope', IEEE Photonics Technol. Lett., 1997, 9, (7), pp. 973-975
5. SAKAGUCHI, S., and TODOROKI, s.: 'Rayleigh scattering in silica glasses', J. Am. Ceram. Soc., 1996, 79, (11), pp. 2821-2824
6. TODD, M., JOHNSON, G.A., and CHANG, C.C.: 'Passive, light intensity independent interferometric method for fibre Bragg gratings interrogation', Electron. Lett., 1999, 35, (22), pp. 1970-1971
7. WILLIAMS, K.J., DANDRIDGE, A., KERSEY, A.D., WELLER, J.F., YUREK, A.M., and TVETEN, A.B.: 'Interferometric measurement of low-frequency phase noise characteristics of diode laser pumped Nd:YAG ring laser', Electron. Lett., 1989, 25, (12), pp. 774-776