Analysis of the technique of dark speckles for detection of exo-planets;Analyse de la technique de tavelures obscures pour la detection d'exo-planetes

Journal of Optics A: Pure and Applied Optics

Volumn 2, Issue 5, 2000, Pages 411-421

  Aime, Claude ^a  

^a UNIVERSITÉ DE NICE SOPHIA ANTIPOLIS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; DEMODULATION; HIGH INTENSITY LIGHT; INTERFEROMETRY; PHOTOELECTRON SPECTROSCOPY; PHOTONS; PLANETS; POISSON DISTRIBUTION; SIGNAL TO NOISE RATIO; SPECKLE;

DARK SPECKLE TECHNIQUES; EXO-PLANETS; PIXELS;

ASTRONOMY;

EID: 0034270619     PISSN: 14644258     EISSN: None     Source Type: Journal    
DOI: 10.1088/1464-4258/2/5/311     Document Type: Article

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