Study on atomic density changes in the liquid Al-Si alloys by X-ray diffraction method

Journal of Materials Science Letters

Volumn 19, Issue 17, 2000, Pages 1583-1585

  Wang, Weimin ^a   Bian, Xiufang ^a   Qin, Jingyu ^a   Fan, Ton Gxiang ^b  

^a SHANDONG UNIVERSITY OF TECHNOLOGY   (China)

^b SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; COMPUTATIONAL METHODS; LIQUID METALS; METALLIC MATRIX COMPOSITES; PARTICLES (PARTICULATE MATTER); THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS;

ATOMIC DENSITY;

ALUMINUM ALLOYS;

EID: 0034269508     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1006741626728     Document Type: Article

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