Addition of SiO2 to increase coercivity and squareness ratio of Ba ferrite films for perpendicular magnetic recording media

IEICE Transactions on Electronics

Volumn E83-C, Issue 9, 2000, Pages 1489-1493

  Feng, Jie ^a   Funabashi, Nobuhiko ^a   Matsushita, Nobuhiro ^a   Nakagawa, Shigeki ^a   Naoe, Masahiko ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COERCIVE FORCE; CRYSTAL DEFECTS; CRYSTALLIZATION; FERRITES; FILM PREPARATION; MAGNETIC RECORDING; MAGNETIZATION; MAGNETOMETERS; REMANENCE; SILICA; X RAY CRYSTALLOGRAPHY;

BARIUM FERRITE FILMS; INTERGRANULAR INTERACTIONS; MAGNETIZATION REVERSAL; REMANENT COERCIVITY; SQUARENESS RATIO; VIBRATING SAMPLE MAGNETOMETER;

MAGNETIC THIN FILMS;

EID: 0034269213     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (9)

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