Contamination effects on the passive optical sample assembly experiments

Journal of Spacecraft and Rockets

Volumn 37, Issue 5, 2000, Pages 567-572

  Pippin, H Gary ^a   Woll, Suzanne L B ^a   Loebs, Valerie A ^a   Bohnhoff Hlavacek, Gail ^a  

^a BOEING COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTAMINATION; OPTICAL SYSTEMS; OXYGEN; PARTICULATE EMISSIONS; RISK MANAGEMENT; SOLAR RADIATION; SPUTTERING; X RAY PHOTOELECTRON SPECTROSCOPY;

PASSIVE OPTICAL SAMPLE ASSEMBLY;

SPACE STATIONS;

EID: 0034268751     PISSN: 00224650     EISSN: None     Source Type: Journal    
DOI: 10.2514/2.3628     Document Type: Article

References (3)

1. Crutcher, R., "Materials SIG Quantification and Characterization of Surface Contaminants," NASA CP 3162, Pt. 1, Nov. 1991.
2. Zwiener, J. M., Kamenetzky, R. R., Vaughn, J. A., and Finckenor, M. M., "Contamination Observed on the Passive Optical Sample Assembly I Experiment," Society of Photo-Optical Instrumentation Engineers, Paper 3427-20, July 1998.
3. Mossman, D. L., Barsch, M. K., and Greenberg, S. A., "Ultraviolet and Electron Irradiation of DC-704 Siloxane Oil on Zinc Ortho-Titanate Paint," AIAA Paper 82-0865, June 1982.