New method for size control of ultrafine particles and effect of electric field

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 9 A, 2000, Pages 5252-5255

  Suzuki, Hitoshi ^b   Nakada, Toshitaka ^b   Saito, Yoshio ^a   Kaito, Chihiro ^b  

^a KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

^b RITSUMEIKAN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; ELECTRON DIFFRACTION; HIGH RESOLUTION ELECTRON MICROSCOPY; INDIUM COMPOUNDS; MASS TRANSFER; PARTICLE SIZE ANALYSIS; PARTICLES (PARTICULATE MATTER);

MASS DENSITY; OXYGEN DEFECTS; ULTRAFINE PARTICLES;

SMOKE;

EID: 0034268371     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.5252     Document Type: Article

References (12)

1. R. Uyeda: Progress in Materials Science (Pergamon, Oxford, 1991) Vol. 35, pp. 1-96.
2. R. Kubo: J. Phys. Soc. Jpn. 17 (1962) 975.
3. R. Uyeda: Morphology of Crystals, ed. I. Sunagawa (Terra, Tokyo, 1987) Chap. 6, pp. 369-508.
4. C. Kaito and K. Fujita: Jpn. J. Appl. Phys. 25 (1986) 496.
5. C. Kaito, A. Nonaka, S. Kimura, N. Suzuki and Y. Saito: J. Cryst. Growth 186 (1998) 386.
6. C. Kaito: Jpn. J. Appl. Phys. 17 (1978) 601.
7. C. Kaito and K. Fujita: J. Cryst. Growth 76 (1986) 132.
8. W. G. Wyckoff: Crystal Structure (John Wiley & Sons, New York, 1948) 2nd ed., Vol. 2, Chap. 5, p. 1.
9. C. Kaito, K. Fujita, H. Shibahara and M. Shiojiri: Jpn. J. Appl. Phys. 16 (1977) 697.
10. P. Gado: Acta Phys. Hung. 18 (1965) 111.
11. S. Iijima: J. Solid State Chem. 14 (1975) 52.
12. T. Miyano, M. Iwanishi and C. Kaito: Jpn. J. Appl. Phys. 22 (1983) 863.