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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 9 B, 2000, Pages 5437-5440

Influence of La0.5Sr0.5CoO3 heterostructure electrodes on Pb(Zr, Ti)O3 thin film properties

(5) Im, Ki Vin a Kuh, Bong Jin a Park, Soon Oh b Lee, Sang In b Choo, Woong Kil a

a Korea Advanced Institute of Science and Technology (KAIST) (South Korea)

b SAMSUNG Electronics (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; ELECTRIC PROPERTIES; ELECTRODES; FATIGUE OF MATERIALS; FERROELECTRICITY; LANTHANUM COMPOUNDS; LEAD COMPOUNDS; LOW TEMPERATURE EFFECTS; MAGNETIC HYSTERESIS; MAGNETRON SPUTTERING;

LANTHANUM STRONTIUM COBALT OXIDE; LEAD ZISCONATE TITANATE;

FERROELECTRIC THIN FILMS;

EID: 0034262649 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.39.5437 Document Type: Article

Times cited : (13)

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