메뉴 건너뛰기




Volumn 373, Issue 1-2, 2000, Pages 84-88

Characterization of sputtered Ta-Ru thin films for ink-jet heater applications

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC POTENTIAL; HEAT TREATMENT; OXIDATION; PASSIVATION; SEMICONDUCTING SILICON; SPUTTERING; TANTALUM ALLOYS; THERMODYNAMICS; THIN FILMS;

EID: 0034262476     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01098-1     Document Type: Article
Times cited : (4)

References (15)
  • 6
    • 85031544649 scopus 로고    scopus 로고
    • US Patent No. 4532530, 21 August, 1985
    • W.G. Hawkins, US Patent No. 4532530, 21 August, 1985.
    • Hawkins, W.G.1
  • 10


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.