Evolution of magnetization reversal on patterned magnetic elements

IEEE Transactions on Magnetics

Volumn 36, Issue 5 I, 2000, Pages 2978-2980

  Wu, J C ^a,b   Huang, H W ^b   Wu, Te Ho ^c  

^a IEEE   (Taiwan)

^b NATIONAL CHANGHUA UNIVERSITY OF EDUCATION   (Taiwan)

^c NATIONAL YUNLIN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

Magnetic force microscope; Magnetization reversal; Patterned permalloy thin film

Indexed keywords

COERCIVE FORCE; ELECTRIC CURRENTS; MAGNETIC DOMAINS; MAGNETIC FIELD EFFECTS; MAGNETIZATION; METALLIC FILMS; MICROSCOPIC EXAMINATION;

MAGNETIC FORCE MICROSCOPY (MFM); MAGNETIZATION REVERSAL;

MAGNETIC THIN FILMS;

EID: 0034260734     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.908646     Document Type: Article

References (7)

1. Domain wall motion in micron-sized permalloy elements
2. Magnetization reversal process of NiFe elements exchange coupled by NiO antiferromagnetic films
3. In-situ magnetoresistance measurements on spin valve elements combined with Lorentz transmission electron microscopy
4. In-situ investigation of patterned magnetic domain structures using magnetic force microscope
5. Empirical correlation between electrical current and the induced magnetic field on conducting strip
6. Self-consistent domain theory in soft ferromagnetic media. I. Solenoidal distributions in elliptical thin-film elements
7. Magnetization reversal in patterned single domain elements