Study on soft-particle intrusion in a head/disk interface of load/unload drives

IEEE Transactions on Magnetics

Volumn 36, Issue 5 I, 2000, Pages 2745-2747

  Xu, Junguo ^a   Tokisue, Hiromitsu ^a   Kawakubo, Youichi ^b  

^a HITACHI LTD   (Japan)

^b SHINSHU UNIVERSITY   (Japan)

Author keywords

Contamination; Head disk interface; Load unload drives; Soft particles

Indexed keywords

ADHESION; INTERFACES (MATERIALS); MAGNETIC DISK STORAGE; MAGNETIC RECORDING; OPTICAL MICROSCOPY;

HARD DISK DRIVES (HDD); HEAD/DISK INTERFACES;

MAGNETIC HEADS;

EID: 0034260550     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.908578     Document Type: Article

References (3)

1. Dynamic head loading for PCMCIA hard-disk drives
2. Load/unload technology for disk drives
3. Particle induced damage on heads and disks due to fine particles of different materials