Observation of Barkhausen noise in a 20 × 20 μm permalloy thin film square dot

IEEE Transactions on Magnetics

Volumn 36, Issue 5 I, 2000, Pages 3087-3089

  Callegaro, Luca ^a,b   Puppin, Ezio ^c   Ricci, Simona ^b  

^a ISTITUTO ELETTROTECNICO NAZIONALE GALILEO FERRARIS   (Italy)

^b INFM   (Italy)

^c POLITECNICO DI MILANO   (Italy)

Author keywords

Artificially structured materials (patterned films); Barkhausen effect; Magnetic domains; Magnetization processes; Magneto optic Kerr effect; Soft magnetic materials

Indexed keywords

ELLIPSOMETRY; KERR MAGNETOOPTICAL EFFECT; MAGNETIC DOMAINS; MAGNETIC HYSTERESIS; MAGNETIC RECORDING; MAGNETIZATION; MAGNETOOPTICAL DEVICES; SOFT MAGNETIC MATERIALS; SPURIOUS SIGNAL NOISE; STATISTICAL METHODS;

ARTIFICIALLY STRUCTURED MATERIALS; BARKHAUSEN EFFECTS; PERMALLOYS;

MAGNETIC THIN FILM DEVICES;

EID: 0034260540     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.908690     Document Type: Article

References (11)

1. Barkhausen effect in magnetic thin films: Experimental noise spectra
2. Barkhausen noise in thin-film recording heads
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4. Focussed Kerr ellipsometry for Barkhausen jumps observation
5. Magneto-optical measurements on mechanically stressed thin ferromagnetic films
6. Anomalous demagnetization process at very low temperature in Nd-Fe-B magnets
7. Reproducibility of magnetic avalanches in an Fe-Ni-Co ferromagnet
8. Micromagnetics of soft magnetic thin films in presence of defects