Effect of angle dependent attempt frequency on Arrhenius-Neel thermal decay in thin film media

IEEE Transactions on Magnetics

Volumn 36, Issue 5 I, 2000, Pages 2459-2461

  Igarashi, M ^a   Akagi, F ^a   Yoshida, K ^b   Nakatani, Y ^c  

^a HITACHI LTD   (Japan)

^b KOGAKUIN UNIVERSITY   (Japan)

^c UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

Author keywords

Angle dependent attempt frequency; Arrhenius Neel; Thermal fluctuation; Time dependent coercivity

Indexed keywords

COERCIVE FORCE; MAGNETIC ANISOTROPY; NUMERICAL METHODS; REMANENCE; THERMAL EFFECTS;

ARRHENIUS-NEEL THERMAL DECAY;

MAGNETIC THIN FILMS;

EID: 0034260536     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.908465     Document Type: Article

References (14)

1. Experimental study of thermal decay in high-density magnetic recording media
2. Kinetic effects in coercivity measurements
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6. Computer simulation of thermal fluctuation of a fine magnetic particle
7. Analysis of the attempt frequency dependence on external field
8. A Lagrangian formulation of the gyromagnetic equation of the magnetization field
9. Numerical simulations of the effect of record field pulse length on medium coereivity at finite temperatures
10. High speed switching in magnetic recording media
11. Computer simulation of magnetization switching in high-data-rate hard-disk media
12. Switching field time dependence of thin film media
13. Switching field time dependence of thin film media