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Volumn 64, Issue 1, 2000, Pages 45-54

Induced defects and structural changes resulting from the processing of CdTe and CdS thin film

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPOSITION EFFECTS; DEFECTS; INTERDIFFUSION (SOLIDS); INTERFACES (MATERIALS); MATHEMATICAL MODELS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTING CADMIUM TELLURIDE; SUBSTRATES; THERMOLUMINESCENCE; THIN FILMS;

EID: 0034259133     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(00)00042-8     Document Type: Article
Times cited : (5)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.