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Volumn 26, Issue 9, 2000, Pages 778-780

Nonequilibrium processes in capacitive sensors based on porous silicon

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0034258224     PISSN: 10637850     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1315491     Document Type: Article
Times cited : (2)

References (16)
  • 2
    • 0004140205 scopus 로고    scopus 로고
    • INSPEC, London, EMIS Datareviews Series
    • Properties of Porous Silicon, Ed. by L. Canham (INSPEC, London, 1997), EMIS Datareviews Series, No. 18.
    • (1997) Properties of Porous Silicon , vol.18
    • Canham, L.1
  • 4
    • 0001163822 scopus 로고
    • V. M. Demidovich, G. B. Demidovich, E. I. Dobrenkova, and S. N. Kozlov, Pis'ma Zh. Tekh. Fiz. 18 (14), 57 (1992) [Sov. Tech. Phys. Lett. 18, 459 (1992)].
    • (1992) Sov. Tech. Phys. Lett. , vol.18 , pp. 459


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.