Electron microscopy analysis of decagonal quasicrystals in the Al-Cu-Co-Si system

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 80, Issue 8, 2000, Pages 1795-1809

  Mukhopadhyay, N K ^a   Sastry, G V S ^a   Weatherly, G C ^b  

^a BANARAS HINDU UNIVERSITY   (India)

^b MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COOLING; CRYSTAL STRUCTURE; DIFFUSION; HIGH RESOLUTION ELECTRON MICROSCOPY; QUASICRYSTALS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

CONVERGENT BEAM ELECTRON DIFFRACTION PATTERNS; DECAGONAL QUASICRYSTALS; SATELLITE SPOTS; SLOW COOLING;

ALUMINUM ALLOYS;

EID: 0034256745     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418610008219085     Document Type: Article

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