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Volumn 2, Issue 15, 2000, Pages 3523-3527

On the advantages of the use of the three-element detector system for measuring EDXRD patterns to follow the crystallisation of open-framework structures

Author keywords

[No Author keywords available]

Indexed keywords

PHOSPHATE; SILICATE;

EID: 0034253766     PISSN: 14639076     EISSN: None     Source Type: Journal    
DOI: 10.1039/b004171h     Document Type: Article
Times cited : (47)

References (30)
  • 2
    • 0008276625 scopus 로고    scopus 로고
    • Molecular Sieves, Principles of Synthesis and Identification, Blackie Scientific and Professional, New York
    • (1999)
    • Szostak, R.1
  • 30
    • 0008270982 scopus 로고
    • TREOR, University of Stockholm, Sweden
    • (1990)
    • Warner, P.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.