메뉴 건너뛰기




Volumn 49, Issue 3-4, 2000, Pages 169-194

Balanced static elimination in variable ion mobility environments

Author keywords

Air flow; Charge decay; Mobility; Nitrogen corona; Semiconductor testing; Static elimination

Indexed keywords

CARRIER MOBILITY; ELECTRIC CORONA; IONIC CONDUCTION; NITROGEN; SEMICONDUCTOR DEVICE TESTING; TEMPERATURE;

EID: 0034251486     PISSN: 03043886     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3886(00)00017-6     Document Type: Article
Times cited : (28)

References (26)
  • 15
    • 0017630047 scopus 로고
    • The electric field and air flow effects on the current and ion densities in the needle-plate in duct geometry
    • C.G. Noll, The electric field and air flow effects on the current and ion densities in the needle-plate in duct geometry, in: Conf. Rec. IEEE Ind. Appl. Soc., 1977, pp. 700-706.
    • (1977) In: Conf. Rec. IEEE Ind. Appl. Soc. , pp. 700-706
    • Noll, C.G.1
  • 20
    • 0039265249 scopus 로고    scopus 로고
    • United States Patent 3,156,847, issued 21 April 1960
    • H. Schweriner, Ionizing air gun, United States Patent 3,156,847, issued 21 April 1960.
    • Ionizing Air Gun
    • Schweriner, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.