Analysis for charged spacers in FED

IEEE Transactions on Electron Devices

Volumn 47, Issue 8, 2000, Pages 1673-1677

  Choi, Y S ^a   Cha, S N ^a   Jung, S Y ^a   Kim, J W ^a   Jung, J E ^a   Kim, J M ^a  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; COMPUTER SIMULATION; ELECTRON IRRADIATION; LUMINESCENCE; MATHEMATICAL MODELS; MONTE CARLO METHODS; SECONDARY EMISSION;

ELECTRON BOMBARDMENT; FIELD EMISSION DISPLAYS (FED);

ELECTRIC INSULATORS;

EID: 0034251008     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.853047     Document Type: Article

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