Measurement of the efficiency of a silicon surface barrier detector for medium energy ions using a Rutherford backscattering experiment

Measurement Science and Technology

Volumn 11, Issue 8, 2000, Pages

  Sheehan, C ^a   Lennard, W J ^a   Mitchell, J B A ^b  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

^b UNIVERSITÉ DE RENNES 1   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CARBON; COMPUTER SIMULATION; GOLD; ION BEAMS; IONS; KINETIC ENERGY; MATHEMATICAL MODELS; OXYGEN; SILICON SENSORS; TEMPERATURE;

DETECTOR EFFICIENCY; DISSOCIATIVE RECOMBINATION; OXYGEN IONS; SILICON SURFACE BARRIER DETECTOR;

RUTHERFORD BACKSCATTERING SPECTROSCOPY;

EID: 0034250705     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/11/8/101     Document Type: Article

References (35)