Gold-catalysed porous silicon for NOx sensing

Sensors and Actuators, B: Chemical

Volumn 68, Issue 1, 2000, Pages 74-80

  Baratto, C ^a   Sberveglieri, G ^a   Comini, E ^a   Faglia, G ^a   Benussi, G ^a   La Ferrara, V ^b   Quercia, L ^b   Di Francia, G ^b   Guidi, V ^c   Vincenzi, D ^c   Boscarino, D ^d   Rigato, V ^d  

^a UNIVERSITY OF BRESCIA   (Italy)

^b ENEA   (Italy)

^c INFN SEZIONE DI FERRARA   (Italy)

^d LABORATORI NAZIONALI DI LEGNARO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC HUMIDITY; CATALYSIS; CHEMICAL SENSORS; ELECTROCHEMISTRY; ELECTRON MICROSCOPY; GOLD; NITROGEN OXIDES; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON WAFERS; SURFACES;

CLUSTERS; ELECTROCHEMICAL ANODIZATION;

POROUS SILICON;

EID: 0034250132     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-4005(00)00464-0     Document Type: Article

References (11)

1. Canham L. Properties of Porous Silicon. 1997;44-86 INSPEC, London.
2. Harper J., Sailor M.J. Detection of nitric oxide and nitrogen dioxide with photoluminescent porous silicon. Anal. Chem. 68:1996;3713-3717.
3. Schetchter I., Ben-Chorin M., Kux A. Gas sensing properties of porous silicon. Anal. Chem. 67:1995;3727.
4. Gupta P., Corvin V.L., George S.M. Hydrogen desorption kinetics from monohydride and dihydride species on silicon surfaces. Phys. Rev. B. 37:1998;8234-8243.
5. Oatley C.W. The Scanning Electron Microscope. 1972;Cambridge Univ. Press, Cambridge.
6. Lehman V., Gosele U. Feng Z.C., Tsu R. Porous Silicon. 1994;17 World Scientific, Singapore.
7. Smith R.L., Collins S.D. Porous silicon formation mechanism. J. Appl. Phys. 71:1992;R1-R21.
8. Doolittle L.R. Algorithms for the rapid simulation of Rutherford backscattering spectra. Nucl. Instrum. Methods, B. 9:1985;334.
9. Hajnal Z., Szilágyi E., Pászti F., Battistig G. Channeling-like effects due to the macroscopic structure of porous silicon. Nucl. Instrum. Methods, B. 118:1996;617.
10. x monitoring. Sens. Actuators, B. 26-27:1995;89-92.
11. Mares J.J., Kristofik J., Hulicius E. Influence of humidity on transport in porous silicon. Thin Solid Films. 255:1995;272-275.