Robust photo-interferometric technique to obtain the refractive index and thickness of non-absorbing stand-alone films

Measurement Science and Technology

Volumn 11, Issue 8, 2000, Pages 1138-1144

  Martinez Anton, J C ^a  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT INTERFERENCE; LIGHT REFLECTION; PLASTIC FILMS; REFRACTIVE INDEX; SPECTROPHOTOMETRY; THICKNESS MEASUREMENT;

ANISOTROPIC POLYESTER FILM; INTERFERENCE SPECTRUM; PELLICLES; PHOTOMETRIC MAGNITUDES;

INTERFEROMETRY;

EID: 0034249498     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/11/8/307     Document Type: Article

References (15)