Si-MFI crystallization using a "dimer" and "trimer" of TPA studied with small-angle x-ray scattering

Journal of Physical Chemistry B

Volumn 104, Issue 32, 2000, Pages 7600-7611

  De Moor, Peter Paul E A ^a   Beelen, Theo P M ^a   van Santen, Rutger A ^a   Beck, Larry W ^b   Davis, Mark E ^b  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMMONIUM COMPOUNDS; CRYSTAL GROWTH; CRYSTAL STRUCTURE; CRYSTALLIZATION; DISSOLUTION; MORPHOLOGY; NUCLEATION; PARTICLE SIZE ANALYSIS; REACTION KINETICS; SILICA; X RAY SCATTERING; ZEOLITES;

BISTRIPOPYLAMMONIUM HEXAMETHYLENE DIHYDROXIDE; ORGANIC MEDIATED CRYSTALLIZATION; STRUCTURE DIRECTING AGENT;

SILICON COMPOUNDS;

EID: 0034249469     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0006476     Document Type: Article

References (3)

1. Tsuji, K.; Davis, M. E. Microporous Mater. 1997, 11, 53-64.
2. Beck, L. W.; Davis, M. E. Microporous Mesoporous Mater. 1998, 22, 107-114.
3. Pedersen, J. S. J. Appl. Crystallogr. 1994, 27, 595-608.