메뉴 건너뛰기




Volumn 48, Issue 13, 2000, Pages 3533-3543

X-ray study of residual stresses and bending stresses in free-standing Nb/Nb5Si3 microlaminates

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELASTICITY; NIOBIUM; NIOBIUM ALLOYS; POLYCRYSTALLINE MATERIALS; RESIDUAL STRESSES; SPUTTER DEPOSITION; STRESS ANALYSIS; TEXTURES; THERMAL EXPANSION; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 0034248321     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(00)00125-7     Document Type: Article
Times cited : (31)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.