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Volumn 48, Issue 13, 2000, Pages 3533-3543
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X-ray study of residual stresses and bending stresses in free-standing Nb/Nb5Si3 microlaminates
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
ELASTICITY;
NIOBIUM;
NIOBIUM ALLOYS;
POLYCRYSTALLINE MATERIALS;
RESIDUAL STRESSES;
SPUTTER DEPOSITION;
STRESS ANALYSIS;
TEXTURES;
THERMAL EXPANSION;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
BENDING STRESSES;
MICROLAMINATES;
NIOBIUM SILICIDE;
PHYSICAL VAPORDEPOSITION;
LAMINATED COMPOSITES;
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EID: 0034248321
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/S1359-6454(00)00125-7 Document Type: Article |
Times cited : (31)
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References (19)
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