Column readout circuit with global charge amplifier for CMOS APS imagers

Electronics Letters

Volumn 36, Issue 17, 2000, Pages 1457-1459

  Degerli Y ^a   Lavernhe, F ^a   Magnan, P ^a   Farre P J ^a  

^a UNIVERSITÉ DE TOULOUSE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CORRELATION METHODS; SAMPLING; SENSORS;

ACTIVE PIXEL SENSORS; COLUMN READOUT CIRCUITS; CORRELATED DOUBLE SAMPLING;

CMOS INTEGRATED CIRCUITS;

EID: 0034248278     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20001071     Document Type: Article

References (6)

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2. DEǦERLI, Y., LAVERNHE, F., MAGNAN, P., and FARRÉ, J.: 'Analysis and reduction of signal readout circuitry temporal noise in CMOS image sensors for low-light levels', IEEE Trans. Electron Devices, 2000, 47, (5), pp. 949-962
3. BLANKSBY, A.J., LOINAZ, M.J., INGLIS, D.A., and ACKLAND, B.D.: 'Noise performance for a color CMOS photogate image sensor'. IEEE IEDM'97 Tech. Dig., Washington, DC, 1997, pp. 205-208
4. French Patent No. 9908001, June 1999. PCT International patent pending
5. MOINI, A.: 'Vision chips' (Kluwer Academic Publishers, Boston, 2000)
6. DEǦERLI, Y.: 'Etude, modélisation des bruits et conception des circuits de lecture dans les capteurs d'images à pixels actifs CMOS'. PhD Dissertation, SUPAERO, Toulouse, France, 2000