Sequential Karhunen-Loeve basis extraction and its application to images

IEEE Transactions on Image Processing

Volumn 9, Issue 8, 2000, Pages 1371-1374

  Levy, Avraham ^a   Lindenbaum, Michael ^b  

^a HEWLETT PACKARD LABORATORIES   (United States)

^b TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; APPROXIMATION THEORY; COMPUTATIONAL COMPLEXITY; CONVERGENCE OF NUMERICAL METHODS; CORRELATION METHODS; EIGENVALUES AND EIGENFUNCTIONS; VECTOR QUANTIZATION;

BATCH CALCULATION; KARHUNEN-LOEVE TRANSFORM; MEAN SQUARE ERROR; SEQUENTIAL ALGORITHM; SINGULAR VALUE DECOMPOSITION;

COMPUTER VISION;

EID: 0034247885     PISSN: 10577149     EISSN: None     Source Type: Journal    
DOI: 10.1109/83.855432     Document Type: Article

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