Using of modified trapping model in positron-lifetime study of cold-worked aluminum

Physica Status Solidi (A) Applied Research

Volumn 180, Issue 2, 2000, Pages 439-458

  Cizek J ^a   Prochazka I ^a   Kmjec T ^a   Vostry P ^a  

^a CHARLES UNIVERSITY   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; DISLOCATIONS (CRYSTALS); ELECTRIC CONDUCTIVITY; POLYCRYSTALLINE MATERIALS; TENSILE STRESS; TRANSMISSION ELECTRON MICROSCOPY;

CONVENTIONAL TRAPPING MODELS (CTM); MODIFIED TRAPPING MODELS (MTM); POSITRON LIFETIME (PL);

ALUMINUM;

EID: 0034246885     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200008)180:2<439::AID-PSSA439>3.0.CO;2-9     Document Type: Article

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