In-situ STM studies of the self-assembling formation of boron surface phases on Si(111)

Applied Surface Science

Volumn 162, Issue , 2000, Pages 384-389

  Stimpel, T ^a   Schulze, J ^a   Hoster, H E ^a   Eisele, I ^a   Baumgartner H ^a  

^a BUNDESWEHR UNIVERSITY MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BORON; CHEMICAL BONDS; CRYSTAL ATOMIC STRUCTURE; CRYSTAL ORIENTATION; DEPOSITION; EVALUATION; SCANNING TUNNELING MICROSCOPY; SILICON WAFERS; SURFACE PHENOMENA; SURFACE STRUCTURE; VACUUM APPLICATIONS;

ADATOMS; DANGLING BONDS; SURFACE RECONSTRUCTION;

SEMICONDUCTOR METAL BOUNDARIES;

EID: 0034246547     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00220-8     Document Type: Article

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