Atomic force microscopy study of oscillatory surface roughening in anodic dissolution of sputter-deposited nickel films

Journal of Chemical Physics

Volumn 113, Issue 6, 2000, Pages 2397-2399

  Saitou, M ^a   Makabe, A ^a   Tomoyose, T ^a  

^a UNIVERSITY OF THE RYUKYUS   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; ATOMIC FORCE MICROSCOPY; CORRELATION METHODS; CURRENT DENSITY; DEPOSITION; DISSOLUTION; ELECTROCHEMISTRY; FILM GROWTH; MATHEMATICAL MODELS; NICKEL; REACTION KINETICS; SURFACE ROUGHNESS;

ELECTROCHEMICAL DISSOLUTION;

METALLIC FILMS;

EID: 0034246515     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.482054     Document Type: Article

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