Electron capture by fluorinated fullerene anions in collisions with Xe atoms

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 62, Issue 2, 2000, Pages 023202-023201

  Boltalina, O V ^a,b   Hvelplund, P ^a   Jorgensen T J D ^a   Larsen, M C ^a   Larsson, M O ^a   Sharoitchenko, D A ^a,b  

^a AARHUS UNIVERSITY   (Denmark)

^b MOSCOW STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRAPS; FLUORINE; FULLERENES; INFRARED SPECTROSCOPY; MASS SPECTROMETRY; MATHEMATICAL MODELS; MOLECULAR STRUCTURE; NEGATIVE IONS; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; PLASMA SOURCES; XENON;

ELECTRO SPRAY ION SOURCE; ELECTRON CAPTURE; ELEMENTAL ANALYSIS; FLUORINATED FULLERENE; MASS ANALYZED ION KINETIC ENERGY; THERMAL SURFACE DESORPTION;

ATOMIC PHYSICS;

EID: 0034246145     PISSN: 10502947     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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