Determination of molecular orientation by angular dependence of second harmonic intensity and second harmonic phase measurements

Optics Communications

Volumn 182, Issue 4, 2000, Pages 457-466

  Flueraru, C ^a,b   Schrader, S ^b   Zauls, V ^b   Dietzel, B ^c   Motschmann, H ^a  

^a MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

^b UNIVERSITY OF POTSDAM   (Germany)

^c Kantstr 5 D 12484 Teltow   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; GLASS; LANGMUIR BLODGETT FILMS; LIGHT POLARIZATION; MOLECULAR ORIENTATION; OPTICAL RESOLVING POWER; QUARTZ; SECOND HARMONIC GENERATION; SILICON; SUBSTRATES; TENSORS;

FRESNEL FIELD CORRECTION FACTORS; SECOND ORDER SUSCEPTIBILITY TENSORS;

OPTICAL COMMUNICATION;

EID: 0034245856     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(00)00847-6     Document Type: Article

References (12)

1. Penner T., Motschmann H., Armstrong N., Ezenyilimba M., Wiliams D.J. Nature. 49:1994;367.
2. Y.R. Shen, The Principles of Non-linear Optics, Wiley, New York, 1992.
3. Bosshard Ch., Kupfer M., Florsheimer M., Borer T., Gunter P., Tang Q., Zahir S. Thin Solid Films. 210/211:1992;198.
4. Decher G., Tieke B., Bosshard C., Gunter P. Chem. Soc. Chem. Commun. 933:1988.
5. Wijekoon W.M.K.P., Karna S.P., Talapatra G.P., Prasad P.N. J. Opt. Soc. Am. B. 12(2):1993;213.
6. Schrader S., Zauls V., Dietzel B., Flueraru C., Prescher D., Reiche J., Motschmann H., Brehmer L. Mater. Sci. Eng. C. 8/9:1999;527.
7. N. Bloembergen, Nonlinear Optics, W.A. Benjamin, New York, 1965.
8. Heinz T., Tom H., Shen Y. Phys. Rev. A. 28:1983;1883.
9. Provencher P., Roberge M.M., Suau A., Tian K., Munger G., Leblanc R. J. Opt. Soc. Am. B. 12(8):1995;1406.
10. Liu L., Wang G., Lu X., Zheng J., Wang W. J. Opt. Soc. Am. B. 14(2):1997;382.
11. Stolle R., Marowsky G., Schwarzberg E., Berkovic G. Appl. Phys. B. 63:1996;491.
12. Kajikawa K., Wang L.M., Isoshima T., Wada T., Knoll W., Sasabe H., Okada S., Nakanishi H. Thin Solid Films. 284/285:1996;612.